[GitHub] [spark] kiszk commented on a change in pull request #29259: [SPARK-29918][SQL][FOLLOWUP][TEST] Fix endianness issues in tests in RecordBinaryComparatorSuite

[GitBox <gi...@apache.org>]

kiszk commented on a change in pull request #29259:
URL: https://github.com/apache/spark/pull/29259#discussion_r461797707



##########
File path: sql/core/src/test/java/test/org/apache/spark/sql/execution/sort/RecordBinaryComparatorSuite.java
##########
@@ -261,40 +263,58 @@ public void testBinaryComparatorForNullColumns() throws Exception {
   public void testBinaryComparatorWhenSubtractionIsDivisibleByMaxIntValue() throws Exception {
     int numFields = 1;
 
+    long row1Data = 11L;
+    long row2Data = 11L + Integer.MAX_VALUE;
+
+    // BinaryComparator compares longs in big-endian byte order.
+    if (ByteOrder.nativeOrder().equals(ByteOrder.LITTLE_ENDIAN)) {
+      row1Data = Long.reverseBytes(row1Data);
+      row2Data = Long.reverseBytes(row2Data);
+    }
+
     UnsafeRow row1 = new UnsafeRow(numFields);
     byte[] data1 = new byte[100];
     row1.pointTo(data1, computeSizeInBytes(numFields * 8));
-    row1.setLong(0, 11);
+    row1.setLong(0, row1Data);
 
     UnsafeRow row2 = new UnsafeRow(numFields);
     byte[] data2 = new byte[100];
     row2.pointTo(data2, computeSizeInBytes(numFields * 8));
-    row2.setLong(0, 11L + Integer.MAX_VALUE);
+    row2.setLong(0, row2Data);
 
     insertRow(row1);
     insertRow(row2);
 
-    Assert.assertTrue(compare(0, 1) > 0);
+    Assert.assertTrue(compare(0, 1) < 0);
   }
 
   @Test
   public void testBinaryComparatorWhenSubtractionCanOverflowLongValue() throws Exception {
     int numFields = 1;
 
+    long row1Data = Long.MIN_VALUE;
+    long row2Data = 1;
+
+    // BinaryComparator compares longs in big-endian byte order.
+    if (ByteOrder.nativeOrder().equals(ByteOrder.LITTLE_ENDIAN)) {

Review comment:
       IIUC, the intention of this test is to perform the comparison at `compare()` regardless endianness.   
    
   For people, would it be good to add byte pattern to be tested.
   ```
   80 00 00 00 00 00 00 00
   00 00 00 00 00 00 00 01
   ```




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