[jira] [Created] (ACCUMULO-2849) Add scan batch size configurability and write delay to memory stress test

["Bill Havanki (JIRA)" <ji...@apache.org>]

Bill Havanki created ACCUMULO-2849:
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             Summary: Add scan batch size configurability and write delay to memory stress test
                 Key: ACCUMULO-2849
                 URL: https://issues.apache.org/jira/browse/ACCUMULO-2849
             Project: Accumulo
          Issue Type: Improvement
          Components: test
            Reporter: Bill Havanki
            Assignee: Bill Havanki
            Priority: Minor
             Fix For: 1.5.2, 1.6.1, 1.7.0


I had the opportunity to work with the memory stress tool created under ACCUMULO-2789. Two features which I added to help the tests along would be helpful:

# Allowing the scanner batch size to be configured, to reduce memory demand when fetching very large keys or values
# Adding a configurable write delay, to reduce pressure on tablet servers to minor compact.



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