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Posted to dev@lucene.apache.org by "Uwe Schindler (JIRA)" <ji...@apache.org> on 2015/07/01 23:30:04 UTC
[jira] [Commented] (LUCENE-6652) Remove tons of
BytesRefAttribute/BytesRefAttributeImpl duplicates in tests
[ https://issues.apache.org/jira/browse/LUCENE-6652?page=com.atlassian.jira.plugin.system.issuetabpanels:comment-tabpanel&focusedCommentId=14611028#comment-14611028 ]
Uwe Schindler commented on LUCENE-6652:
---------------------------------------
This will be fixed through issue LUCENE-6653 (one patch for both).
> Remove tons of BytesRefAttribute/BytesRefAttributeImpl duplicates in tests
> --------------------------------------------------------------------------
>
> Key: LUCENE-6652
> URL: https://issues.apache.org/jira/browse/LUCENE-6652
> Project: Lucene - Core
> Issue Type: Test
> Affects Versions: 5.2.1
> Reporter: Uwe Schindler
> Assignee: Uwe Schindler
> Fix For: 5.3, Trunk
>
>
> While implementing LUCENE-6651, I found a lot of duplicates of the same class (in different variants) which is used by tests to generate binary terms. As we now have support for binary terms in Field class itsself, we should remove all of those attributes accross tests.
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