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Posted to notifications@accumulo.apache.org by "Josh Elser (JIRA)" <ji...@apache.org> on 2015/05/11 18:41:03 UTC
[jira] [Resolved] (ACCUMULO-2849) Add scan batch size
configurability and write delay to memory stress test
[ https://issues.apache.org/jira/browse/ACCUMULO-2849?page=com.atlassian.jira.plugin.system.issuetabpanels:all-tabpanel ]
Josh Elser resolved ACCUMULO-2849.
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Resolution: Fixed
> Add scan batch size configurability and write delay to memory stress test
> -------------------------------------------------------------------------
>
> Key: ACCUMULO-2849
> URL: https://issues.apache.org/jira/browse/ACCUMULO-2849
> Project: Accumulo
> Issue Type: Improvement
> Components: test
> Reporter: Bill Havanki
> Assignee: Bill Havanki
> Priority: Minor
> Fix For: 1.7.0, 1.6.1, 1.5.2
>
> Time Spent: 0.5h
> Remaining Estimate: 0h
>
> I had the opportunity to work with the memory stress tool created under ACCUMULO-2789. Two features which I added to help the tests along would be helpful:
> # Allowing the scanner batch size to be configured, to reduce memory demand when fetching very large keys or values
> # Adding a configurable write delay, to reduce pressure on tablet servers to minor compact.
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