Re: [PR] [SPARK-51093][SQL] Fix minor endianness issues in tests. [spark]

["MaxGekk (via GitHub)" <gi...@apache.org>]

MaxGekk commented on code in PR #49812:
URL: https://github.com/apache/spark/pull/49812#discussion_r1943671738


##########
sql/catalyst/src/test/scala/org/apache/spark/sql/catalyst/util/ArrayBasedMapBuilderSuite.scala:
##########
@@ -143,12 +145,15 @@ class ArrayBasedMapBuilderSuite extends SparkFunSuite with SQLHelper {
     val builder = new ArrayBasedMapBuilder(new StructType().add("i", "int"), IntegerType)
     builder.put(InternalRow(1), 1)
     builder.put(InternalRow(2), 2)
+    // The UnsafeRow.toString() method output is based on the underlying bytes and is
+    // endian dependent.
+    val keyAsString = if (nativeOrder().equals(BIG_ENDIAN)) "[0,100000000]" else "[0,1]"
     // By default duplicated map key fails the query.
     checkError(
       exception = intercept[SparkRuntimeException](builder.put(unsafeRow, 3)),
       condition = "DUPLICATED_MAP_KEY",
       parameters = Map(
-        "key" -> "[0,1]",
+        "key" -> keyAsString,

Review Comment:
   Can't you just replace `[0,1]` by `unsafeRow.toString`?



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