[jira] [Commented] (FLINK-17909) Add a TestCatalog to hold the serialized meta data to uncover more potential bugs

["Jark Wu (Jira)" <ji...@apache.org>]

    [ https://issues.apache.org/jira/browse/FLINK-17909?page=com.atlassian.jira.plugin.system.issuetabpanels:comment-tabpanel&focusedCommentId=17116387#comment-17116387 ] 

Jark Wu commented on FLINK-17909:
---------------------------------

OK. I renamed the title and description to introduce a `TestCatalog` which will hold the serialized meta data. I prefer to have a better testing coverage in table module, rather moving tests into connector modules. 

> Add a TestCatalog to hold the serialized meta data to uncover more potential bugs
> ---------------------------------------------------------------------------------
>
>                 Key: FLINK-17909
>                 URL: https://issues.apache.org/jira/browse/FLINK-17909
>             Project: Flink
>          Issue Type: Improvement
>          Components: Table SQL / API, Table SQL / Planner
>            Reporter: Jark Wu
>            Priority: Major
>             Fix For: 1.11.0
>
>
> Currently, the builtin {{GenericInMemoryCatalog}} hold the meta objects in HashMap. However, this lead to many bugs when users switch to some persisted catalogs, e.g. Hive Metastore. For example, FLINK-17189, FLINK-17868, FLINK-16021. 
> That is because the builtin {{GenericInMemoryCatalog}} doesn't cover the important path of serialization and deserialization of meta data. We missed some important meta information (PK, time attributes) when serialization and deserialization which lead to bugs. 
> So I propose to add a {{TestCatalog}} to hold the serialized meta data to cover the serialization and deserializtion path. The serialized meta data may be in the {{Map<String, String>}} properties format. 



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